Wafer Sorter

High‑Integration & Mutiple Function Wafer Sorter

Features & Benefits

Diverse Module OptionsCapable of measuring flatness, resistance, front/back surface defect inspection, edge inspection, laser‑etched code detection, IR (infrared) pinhole detection, and more

AI RejudgementThe software algorithm, integrated with an AI-assisted review system, enables more precise defect classification

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